Electron Probe Microanalyzer (EPMA) data from a selection of tephra occurrences drilled at IODP Sites 350-U1436 and 350-U1437. (NERC grant NE/M005240/1)
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Provided by Czech Geological Survey
Get early access to Electron Probe Microanalyzer (EPMA) data from a selection of tephra occurrences drilled at IODP Sites 350-U1436 and 350-U1437. (NERC grant NE/M005240/1) API!
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Dataset information
Catalog
Country of origin
Updated
Created
Available languages
Czech
Keywords
NERC_DDC
Datasource
Quality scoring
155
Dataset description
Many tephra layers were identified in sediment cores drilled during IODP Expedition 350. Here, 1092 glass shards from 76 tephra occurrences (layer or patch) were analysed using electron probe microanalyses (EPMA). Data are not averaged, nor normalised. Geochemistry data were collected for: SiO2, TiO2, Al2O3, Cr2O3, FeO, MnO, MgO, CaO, Na2O, K2O, P2O5, SO3, Cl and O. Secondary standard data are given, as well as beam setup conditions. The data were obtained using the instruments at the University of Bristol, over two sessions during October and November 2014.
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