A Dataset of Random Dipole Distributions and Wire-traced Structures for Near-Field-Scanning Simulations in NEC

This dataset contains the DUT models used for random dipole distributions and wire‑traced structures in near‑field‑scanning simulations performed with NEC. It includes the corresponding simulations of the reference electric fields as well as the single‑probe near‑field scanning voltage values. The dataset is organized into two categories—random dipole distributions and wire‑traced structures—which are used for training, validation, and testing in the work “Near‑Field Scanning Probe Compensation based on a Hybrid Neural Network.” These models are designed to approximate a wide range of DUT scenarios, representing different emission profiles and PCB trace segments for subsequent simulations and analysis.