Raw data for UV-Selective Optically Transparent Zn(O,S)-Based Solar Cells

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Dataset information

Country of origin
Updated
2021.06.25 00:00
Created
2020.09.20
Available languages
English
Keywords
hybrids, transparent photovoltaics, ultraviolet-selective solar cells, widebandgaps, Zn(O,S)
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Dataset description

In the following the raw data lying the foundation of the paper “UV-Selective Optically Transparent Zn(O,S)-Based Solar Cells” (Lopez-Garcia et al.) published in Solar Rapid Research Letters Vol. 4, 2000470, 2020, are described. They were obtained under the funding provided by the European Union H2020 Framework Programme under Grant Agreement no. 826002 (Tech4Win) and by the Basque Country PI2018-08 (PISCES). UV–vis measurements were acquired with a dual-beam spectrophotometer setup (Perkin Elmer Lambda L35) in transmittance mode (light source and detector normal to sample’s surface (i.e., 0o)) scanning from 300 to 800 nm. Raman spectroscopy was performed with a FHR640 Horiba Jobin–Yvon spectrometer coupled to a Raman probe developed at Institut de Recerca en Energia de Catalunya (IREC) and a cryogenically cooled charge coupled device detector. Measurements were carried out in backscattering configuration and with a 325 nm UV laser as the excitation wavelength. An excitation power density of about 25W/cm2 was used to inhibit thermal effects on the samples. The Raman shift was calibrated using a Si monocrystal reference and adjusting the Raman shift for the main Si band at 520 cm-1. FE-SEM images were acquired with a ZEISS Auriga Series system. The images were acquired at 5 kV, aperture of 20 μm, and working distance of around 4mm with the InLens detector. J–V measurements under illumination were carried out using a homemade setup consisting on a 150W xenon broadband arc Lamp (Thorlabs SLS401) calibrated using a NREL-certified Si reference solar cell (Abet Technologies, Model 15150). Electrical measurements were carried out with a source-measure unit (Keithley 2400) in four-wire sense mode, controlled by the software Tracer (ReRa solutions) using a IEEE 488 GPIB Instrument Control Device (National Instruments GPIB-USB-HS). EQE curves were obtained using a spectral response system (Bentham PVE300) calibrated with a Si photodiode.
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