SEM photomicrograph of experimental fault gouges from the Atacama Fault System (Northern Chile)

This dataset contains scanning electron microscope (SEM) images used in the study “Linking Synthetic Fabrics and Frictional Behavior in Fault Gouges of the Atacama Fault System, Northern Chile” by González, Y.; González, G.; Spagnuolo, E.; Pozzi, G.; and Aretusini, S. The dataset includes high-resolution SEM images acquired in backscattered electron (BSE) mode from experimental fault gouges generated during laboratory friction experiments. Images are provided in *.TIF format together with associated metadata files containing the SEM acquisition parameters. Detailed information about the experiments, file organization, and the index of images is provided in the README.txt file. This publication results from work carried out under Trans-National Access action under the support of EXCITE - EC- HORIZON 2020 - INFRAIA 2020 Integrating Activities for Starting Communities under grant agreement N.101005611. For any further inquiries, please contact ygc005@alumnos.ucn.cl